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MCQs

Total Questions : 78 | Page 4 of 8 pages
Question 31. When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam.
  1.    True
  2.    False
  3.    May be True or False
  4.    Can't say
 Discuss Question
Answer: Option A. -> True
Answer: (a).True
Question 32. In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
  1.    Number, length
  2.    Number, intensity
  3.    Position, length
  4.    Position, intensity
 Discuss Question
Answer: Option D. -> Position, intensity
Answer: (d).Position, intensity
Question 33. Which of the following is the most common instrument for photographic recording of diffraction patterns?
  1.    Debye-Scherrer powder camera
  2.    Gamma camera
  3.    Geiger tube
  4.    Scintillation counter
 Discuss Question
Answer: Option A. -> Debye-Scherrer powder camera
Answer: (a).Debye-Scherrer powder camera
Question 34. With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?
  1.    Coolidge equation
  2.    Bragg’s equation
  3.    Debye equation
  4.    Scherrer equation
 Discuss Question
Answer: Option B. -> Bragg’s equation
Answer: (b).Bragg’s equation
Question 35. Diffractometers are similar to which of the following?
  1.    Optical grating spectrometer
  2.    Prism spectrometer
  3.    Photo multiplier
  4.    Photovoltaic cell
 Discuss Question
Answer: Option A. -> Optical grating spectrometer
Answer: (a).Optical grating spectrometer
Question 36. In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
  1.    Number
  2.    Position
  3.    Length
  4.    Distance between lines
 Discuss Question
Answer: Option A. -> Number
Answer: (a).Number
Question 37. In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
  1.    Quality of the sample, size of the slit
  2.    Quality of the slit, size of the sample
  3.    Thickness of the slit, amount of the sample
  4.    Number of slits, composition of the sample
 Discuss Question
Answer: Option B. -> Quality of the slit, size of the sample
Answer: (b).Quality of the slit, size of the sample
Question 38. In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.
  1.    True
  2.    False
  3.    May be True or False
  4.    Can't say
 Discuss Question
Answer: Option A. -> True
Answer: (a).True
Question 39. X-ray absorption meters have which of the following major disadvantages?
  1.    Low accuracy
  2.    Low range
  3.    Low sensitivity
  4.    It is destructive
 Discuss Question
Answer: Option C. -> Low sensitivity
Answer: (c).Low sensitivity
Question 40. Absorption meter is __________ and ____________ of the chemical state of the element concerned.
  1.    Non-destructive, independent
  2.    Destructive, independent
  3.    Non-destructive, dependent
  4.    Destructive, dependent
 Discuss Question
Answer: Option A. -> Non-destructive, independent
Answer: (a).Non-destructive, independent

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